Electrically detected magnetic resonance study of stress‐induced .
. magnetic resonance study of stress‐induced leakage current in thin SiO . This so-called stress-induced leakage current (SILC) may limit the scaling-down .　->

Stress-induced leakage current (SILC) and oxide breakdown: are they .
Stress-Induced Leakage Current (SILC) and Oxide. Breakdown: Are They From the Same Oxide Traps? . buildup is to measure the stress-induced leakage current (SILC) .　->

PII: S0026-2714(00)00027-5
Stress-induced leakage current with properly designed tester may . well above the typical maximum stress-induced leakage. 2. before soft break- down could occur. .　->

APPENDIX A
Stress-induced leakage current in very thin dielectric layers ; S Bruyere, . Time stability of stress induced leakage current in. A Ghidini, .　->

Minority Carrier Tunneling and Stress-Induced Leakage Current for p .
Stress-Induced Leakage Current(SILC) characteristics. and time-to-breakdown(t. bd ) . Stress- Induced Leakage Current(SILC), soft-breakdown(SB) and the .　->

Use Low-Current Measurements for Process Control - 1999-08-01 06:00:00 .
. Gate Induced Drain Leakage (GIDL), Drain Induced Barrier Lowering . Stress Induced . The leakage is induced by tunneling current stress in the thin .　->

Contactless ultra-fast laser probing of radiation-induced leakage .
Radiation-Induced Leakage Current in. Ultra-Thin Oxides . stress-induced leakage current, SILC) as well as after subjecting. the sample to irradiation. .　->

MEMC Electronic Materials, Inc. -- Silicon Wafer Manufacturing
Dislocation-Induced Leakage . there is sufficient stress to break silicon . flow in the other direction, and this constitutes the flow of a leakage current. .　->

Welcome to IEEE Xplore 2.0: Impact of the Ge Content on the Bandgap .
. impact of process-induced stress on the generation current of fully strained Si1 . the Ge content dependence of the bandgap-shrinkage-induced leakage current. .　->

IEEE Xplore# Wrapper Result
Experimental evidence of inelastic tunneling in stress-induced leakage current . to study the transport properties of stress-induced leakage current (SILC) .　->